The analysis of nanoscale features on organic and inorganic surfaces is critical for understanding the mechanisms of surface deposition, reaction and molecular interactions. Such analyses use Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) to determine relevant patterns. We use wavelet analysis to extract recurring patterns on images and allow calculation of length scales associated with the features.
Nazar Ileri is carrying out a study of nanoscale silicon-based biofilters in which AFM and SEM are used extensively for surface characterization. Rajib Mukherjee (LSU) is working on a modeling and simulation study of the Line Edge Roughness problem in SEM images.
Our collaborators in this study include Professor P. Stroeve (UC Davis), Professor J.A. Romagnoli (LSU), Professor W. Sun (Beijing University of Chemical Technology), Dr. J. Tringe and Dr. S. Letant (Lawrence Livermore Laboratory). Our group recently contributed to a study of the effect of nanoscale heterogeneities on the energy dissipation in bone carried out under the guidance of Professor C. Ortiz at MIT.
Related Publications
• W. Sun, R. Mukherjee, P. Stroeve, J.A. Romagnoli and A. Palazoglu, “A Multi-resolution Approach for Line Edge Roughness Detection,” Microelectronics Eng., submitted (2007).
• Tai, K., M. Dao, S. Suresh, A. Palazoglu and C. Ortiz, “Nanoscale Heterogeneity Promotes Energy Dissipation in Bone,” Nature Materials, 6, 454-462 (2007).
• Carmichael, M., A. Maksumov, R. Vidu, A. Palazoglu and P. Stroeve, “Using Wavelets to Analyze AFM Images of Thin Films: Surface Micelles and Supported Bilayers,” Langmuir, 20, 11557-11568 (2004).
• Maksumov, A., R. Vidu, A. Palazoglu and P. Stroeve, “Enhanced Feature Analysis Using Wavelets for Scanning Microscopy Images,” J. Colloid and Interface Science, 272(2), 365-377 (2004).
Funding
Graduate Research and Education in Adaptive bio-Technology (GREAT) Training Program Fellowship for N. Ileri